JJAP: Japanese Journal of Applied Physics
ISSN Online: 1347-4065 / Print: 0021-4922
Special Issues in Vols. 47 (2008) & 48 (2009) FREE until the end of the year. (July 2, 2010)
Announcement: Spotlights (March 26, 2010)
Dry Process
Edited by K. Sasaki et al.
Vol. 49, No. 8, Issue 2 of 4 (August 2010)
Optical Memories
Edited by M. Takeda et al.
Vol. 49, No. 8, Issue 3 of 4 (August 2010)
Scanning Probe Microscopy
Edited by M. Kageshima et al.
Vol. 49, No. 8, Issue 4 of 4 (August 2010)
Invited Review Papers
Invited Rev. Papers Archive- Frequency Metrology with Optical Lattice Clocks [49 (2010) 080001] by Feng-Lei Hong and Hidetoshi Katori
- Radiation Chemistry in Chemically Amplified Resists [49 (2010) 030001] by Takahiro Kozawa and Seiichi Tagawa
- Electrical Phase-Change Memory: Fundamentals and State of the Art [48 (2009) 080001] by Motoyasu Terao, Takahiro Morikawa, and Takeo Ohta
- Resonant Tunneling Diodes for Sub-Terahertz and Terahertz Oscillators [47 (2008) 4375] by Masahiro Asada, Safumi Suzuki, and Naomichi Kishimoto
- Scanning Nonlinear Dielectric Microscopy Nano-Science and Technology for Next Generation High Density Ferroelectric Data Storage [47 (2008) 3311] by Kenkou Tanaka, Yuichi Kurihashi, Tomoya Uda, Yasuhiro Daimon, Nozomi Odagawa, Ryusuke Hirose, Yoshiomi Hiranaga, and Yasuo Cho
- Developments of Plasma Etching Technology for Fabricating Semiconductor Devices [47 (2008) 1435] by Haruhiko Abe, Masahiro Yoneda, and Nobuo Fujiwara
- Development of Electron Holography and Its Applications to Fundamental Problems in Physics [47 (2008) 11] by Akira Tonomura
-
New Vertical-Cavity Surface-Emitting Laser: Its Conception and Evolution
[47 (2008) 1] by Kenichi Iga
Special Issues Vol. 49 (2010)
|
Dry Process; No. 8, Issue 2 (August)
Edited by K. Sasaki et al. |
|
Optical Memories; No. 8, Issue 3 (August)
Edited by M. Takeda et al. |
|
Scanning Probe Microscopy; No. 8, Issue 4 (August)
Edited by M. Kageshima et al. |
|
Ultrasonic Electronics; No. 7, Issue 2 (July)
Edited by K. Hashimoto et al. |
|
Microprocesses and Nanotechnology; No. 6, Issue 2 (June)
Edited by T. Meguro et al. |
|
Printed Electronics; No. 5, Issue 2 (May)
Edited by T. Mori et al. |
|
Advanced Metallization for ULSI Applications; No. 5, Issue 3 (May)
Edited by E. Kondo et al. |
|
Solid State Devices and Materials; No. 4, Issue 2 (April) Edited by K. Shibahara et al. |
|
Active-Matrix Flatpanel Displays and Devices; No. 3, Issue 2 (March) Edited by T. Asano et al. |
|
Carbon Nanotube Nanoelectronics; No. 2, Issue 2 (February) Edited by K. Matsumoto et al. |
|
Molecular Electronics and Bioelectronics; No. 1, Issue 2 (January) Edited by M. Ichikawa et al. |
2009 Impact Factor
1.138
1.138
