Table of Contents

Jpn. J. Appl. Phys. Vol.35(1996)
Part 1, No. 6B, 30 June 1996

Special Issue: Scanning Tunneling Microscopy

3695-3699 : Element-Specific Contrast in Scanning Tunneling Microscopy via Resonant Tunneling

Franz J. Himpsel, Thomas Jung, Reto Schlittler and Jim K. Gimzewski

3700-3705 : Interpretation of Frictional-Force Microscopy Images Based on the Two-Dimensional Stick-Slip Motion of the Tip Atom

Naruo Sasaki, Katsuyoshi Kobayashi and Masaru Tsukada

3706-3709 : Negative Conductance in Coulomb Blockade

Takashi Mii and Kenji Makoshi

3710-3713 : Theoretical Study of Current and Barrier Height between Aluminum Tip
and Silicon Surface in Scanning Tunneling Microscopy

Nobuhiko Kobayashi, Kenji Hirose and Masaru Tsukada

3714-3718 : Reversible Tip-induced Structural Modifications in Scanning Tip Microscopy

Kyeongjae Cho and John D. Joannopoulos

3719-3723 : Scanning Tunneling Microscope Studies on Recovery Processes of Sputter-Induced Surface Defects on Si(111)-7×7

Kazuya Yoneyama and Keiichi Ogawa

3724-3729 : Cross-Sectional Scanning Tunneling Microscopy on Cleaved Si(111): Observation of Novel Reconstruction and Structural and Electrical Properties of MOS Interface

Tadahiro Komeda, Shangjr Gwo and Hiroshi Tokumoto

3730-3733 : Cu Film Growth on a Si(111) Surface Studied by Scanning Tunneling Microscopy

Satoshi Tomimatsu, Tsuyoshi Hasegawa, Makiko Kohno and Shigeyuki Hosoki

3734-3737 : Si Dimer Chain on Si(100)-2× 1:H Surface Fabricated by Scanning Tunneling Microscope

Dehuan Huang and Yoshihisa Yamamoto

3738-3742 : Fabrication of Buried Metal Dot Structure in Split-Gate Wire by Scanning Tunneling Microscope

Nobuyuki Aoki, Keizo Fukuhara, Tomoyuki Kikutani, Akio Oki, Hidenobu Hori and Syoji Yamada

3743-3748 : Scanning Tunneling Microscopy/Scanning Tunneling Spectroscopy Observation of III-V Compound Semiconductor Nanostructures

Joo-Hyong Noh, Hajime Asahi, Seong-Jin Kim, Minori Takemoto and Shun-ichi Gonda

3749-3753 : Scanning Probe Lithography Using a Trimethylsilyl Organosilane Monolayer Resist

Hiroyuki Sugimura, Keiko Okiguchi and Nobuyuki Nakagiri

3754-3758 : Differentiation of Chemically Functional Groups in Stearoyl Amide and Anilide with Scanning Tunneling Microscopy

Hideto Takeuchi, Susumu Kawauchi and Atsushi Ikai

3759-3763 : Scanning Tunneling Microscopy Observation of Copper-Phthalocyanine and Nucleic Acid Base Molecules on Reduced SrTiO₃(100) and Cu(111) Surfaces

Hiroyuki Tanaka and Tomoji Kawai

3764-3766 : Observation of Gold Thin Film on Cesium Graphite Intercalation Compound by Scanning Tunneling Microscopy

Teruyuki Kinno, Miyoko O. Watanabe and Koichi Mizushima

3767-3771 : Investigation of Ferroelastic Domain Boundary Structures of MP ₅O ₁₄ (M: La-Tb) and LaNbO ₄ by Means of Scanning Tunneling Microscope, Atomic Force Microscope, X-Ray and Neutron Diffraction Analyses

Tadashi Kobayashi, Iwao Takei, Mitsuo Machida and Yasutaka Suemune

3772-3774 : Scanning Tunneling Microscopy of UV-Induced Gasification Reaction on Highly Oriented Pyrolytic Graphite

Shun-ei Ozeki, Takeshi Ito, Kiyohiko Uozumi and Izumi Nishio

3775-3777 : Atomic Force Microscopy Images of Liquid-Phase-Adsorbed Pyridine Molecules on Stilbite(010)

Masaharu Komiyama and Minming Gu

3778-3782 : Atomic Force Microscopy of Cracks on Si(100) and GaAs(100) Caused by Vickers Indenter

Guento Misawa, Hirofumi Yamada, Yutaka Seino and Kan Nakayama

3783-3786 : Instrumentation of the High-Vacuum Atomic Force Microscope

Masatoshi Yasutake, Takehiro Yamaoka and Yasunori Nagatani

3787-3792 : Ultrasonic Atomic Force Microscope with Overtone Excitation of Cantilever

Kazushi Yamanaka and Shizuka Nakano

3793-3797 : SiO₂/Si System Studied by Scanning Capacitance Microscopy

Takuma Yamamoto, Yoshihiko Suzuki, Hiroyuki Sugimura and Nobuyuki Nakagiri

Copyright (C) 1996 Publication Board, Japanese Journal of Applied Physics
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