Table of Contents

Jpn. J. Appl. Phys. Vol.38(1999)
Part 1, No. 6B, 30 June 1999

Special Issue: Scanning Tunneling Microscopy

3805-3808 : Numerical Method for Local Density of States and Current Density Decomposed into Eigenchannels in Multichannel System: Nobuhiko Kobayashiand Masaru Tsukada
3809-3812 : Calculations of Scanning Tunneling Microscopic Images of Benzene on Pt(111) and Pd(111), and Thiophene on Pd(111): Don Norimi Futaba and ShirleyChiang
3813-3815 : C-Terminated Reconstruction and C-Chain Structure on Mo₂C(0001) Surface Studied by Low Energy Electron Diffraction and Scanning Tunneling Microscopy: Rong-Li Lo, Ken-ichi Fukui, ShigekiOtani, S. Ted Oyama and YasuhiroIwasawa
3816-3819 : Scanning Tunneling Spectroscopy Study of Fe(001) Using Nonmagnetic W- and Fe-Evaporated Probe Tips: Takeshi Kawagoe,Nobuhiro Kondoh, Yasuo Jimma, Tomoyuki Kotaki and Akiyoshi Itoh
3820-3825 : Scanning Tunneling Microscopy Study of Surface Structure and Magnetism of Fe Thin Films Grown on MgO (001): Agus Subagyo, Kazuhisa Sueoka, Koichi Mukasa and Kazunobu Hayakawa
3826-3829 : Variation of Electronic States in Mesoscopic Scale Structures of TiO₂(110) Surface Observed by Scanning Tunneling Microscopy/Spectroscopy: Yoshiyuki Sakai and Shaw Ehara
3830-3832 : Space-Correlation Analysis of Formate Ions Adsorbed on TiO₂(110): Hiroshi Onishi, Ken-ichi Fukui and Yasuhiro Iwasawa
3833-3836 : Electronic Structure of the Si(100) Surface A Defects Analyzed by Scanning Tunneling Spectroscopy at 80 K: Yasuyuki Sainoo, Tomohiko Kimura, Ryuji Morita, Mikio Yamashita,Kenji Hata and Hidemi Shigekawa
3837-3840 : Structure Transformation of the C Defects Observed at Low Temperature (80 K): Kenji Hata, Ryuji Morita, Mikio Yamashita and Hidemi Shigekawa
3841-3844 : Si(111) Surface under Phase Transitions Studied by the Analysis of Inner Layer Structures Using Bias-Dependent Scanning Tunneling Microscopy: Koji Miyake, Takashi Kaikoh, Yan Jun Li, Haruhiro Oigawa and Hidemi Shigekawa
3845-3848 : Barrier-Height Imaging of Oxygen-adsorbed Si(001)2×1 and Ge(001)2×1 Surfaces: Shu Kurokawa, Hiroshi Yamashita, Jun Yoshikawa and Akira Sakai
3849-3852 : Direct Observation of Strained Layer Formation at the Initial Stage of In Thin Film Growth on Si(100): Osamu Kubo, Jeong Tak Ryu, Hitoshi Tani, Toru Harada,Mitsuhiro Katayama and Kenjiro Oura
3853-3855 : Spin-Dependent Surface Characteristics of an Absorbed Hydrogen Atom under a Scanning Tunneling Microscope Environment-Atom Manipulation by Magnetic Field: Makoto Sawamura and KoichiMukasa
3856-3859 : Vibrational-Energy Redistribution in Single-Atom Manipulation by Scanning Tunneling Microscope: Qiang Shi, Dehuan Huang and Qingshi Zhu
3860-3862 : Single Silicon Atom Detection on a Tungsten Tip: Tetsuo Shimizu and Hiroshi Tokumoto
3863-3865 : Cross-Sectional Transmission Electron Microscope Observation of Small Structures Made by Field-Induced Scanning Tunneling Microscope Fabrication: Nobuyuki Aoki, Yuichi Ochiai, Chulun Hong, Tomoyuki Kikutani,Hidenobu Hori and Syoji Yamada
3866-3870 : Control of Surface Current on a Si(111) Surface by Using Nanofabrication: Seiji Heike, Satoshi Watanabe, Yasuo Wada and Tomihiro Hashizume
3871-3874 : Photoinduced Current Properties of InAs-covered GaAs Studied by Scanning Tunneling Microscopy: Hiroshi Yamamoto, Itaru Kamiya and Takuji Takahashi
3875-3878 : Initial Stage of Nitridation of GaAs(001): Atomic Scale View: Takahiro Imayoshi, Haruhiro Oigawa, Hidemi Shigekawa and Hiroshi Tokumoto
3879-3887 : Scanning Tunneling Microscopy of Organic Molecules and Monolayers on Silicon and Germanium (001) Surfaces: Robert J. Hamers, Jennifer S. Hovis, C. Michael Greenlief and David F. Padowitz
3888-3891 : Effect of the Dipole-Dipole Interaction on the Self-Assembly of Cyclodextrin Inclusion Complexes: Satoshi Yasuda, Koji Miyake, JunSumaoka, Makoto Komiyama and Hidemi Shigekawa
3892-3896 : Lateral Conduction Model for Intermolecular Interaction of Self-Assembled Monolayers: Wataru Mizutani, Takao Ishida and Hiroshi Tokumoto
3897-3900 : Self-Assembly and Functional Group Effect of Asymmetric Disulfides on Graphite Studied by Scanning Tunneling Microscopy: Jaegeun Noh, Dongsun Lee, Masahiko Hara, Haiwon Lee, Hiroyuki Sasabe and Wolfgang Knoll
3901-3907 : How Much Chemistry is There in Chemical Force Microscopy?: Rachel McKendry, Maria-Elena Theoclitou, Chris Abell and Trevor Rayment
3908-3911 : Nanometer-Scale Photoelectric Property of Organic Thin Films Investigated by a Photoconductive Atomic Force Microscope: Hiroshi Sakaguchi, Futoshi Iwata, Atsushi Hirai, Akira Sasaki and Toshihiko Nagamura
3912-3917 : Protein Stretching III: Force-Extension Curves of Tethered Bovine Carbonic Anhydrase B to the Silicon Substrate under Native, Intermediate and Denaturing Conditions: Tong Wang and Atsushi Ikai
3918-3931 : Bases of Chemical Force Microscopy by Friction: Energetics and Dynamics of Wearless Friction between Organic Monolayers in Terms of Chemical and Physical Properties of Molecules: Masamichi Fujihira and Takuya Ohzono
3932-3935 : Investigation of Surface Potential of Ferroelectric Organic Molecules by Scanning Probe Microscopy: Xinqi Chen, Hirofumi Yamada, ToshihisaHoriuchi and Kazumi Matsushige
3936-3939 : Observation of a Polystyrene Surface Modified by Ultrasonic Scratching Using Atomic Force Microscopy: Futoshi Iwata, Tarou Matsumoto, Ryuhei Ogawa and Akira Sasaki
3940-3945 : Atomic Force Microscopic Observation of Three-Dimensional Morphological Changes of Neurons When Stimulated by a Neurotransmitter: Tomoko Hosono, Mari Yamanaka, Takuro Tojima, Yukako Yamane, Hisayo Sadamoto, Dai Hatakeyama, Hisashi Haga, Kazushige Kawabata, Kazuhiro Abe and Etsuro Ito
3946-3948 : Force Microscopy Study of SrTiO₃(001) Surfaces with Single Atomic-Layer Steps: Koichiro Iwahori, ShunjiWatanabe, Tadahiro Komeda, MakiKawai,Akira Saito, Yuji Kuwahara and Masakazu Aono
3949-3953 : Development of a Hybrid Scanning Near-field Optical/Tunneling Microscope (SNOM/STM) System: Ken Nakajima, Ruggero Micheletto, Keita Mitsui, Takashi Isoshima, Masahiko Hara,Tatsuo Wada,Hiroyuki Sasabeand Wolfgang Knoll
3954-3957 : Feasibility Studies on a Nanometric Oscillator Fabricated by Surface Diffusion for Use as a Force Detector in Scanning Force Microscopy: Hideki Kawakatsu, Daisuke Saya, Michel deLabachelerie,Hans-J. Hug and Hans-J. Güntherodt
3958-3961 : Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection: Masami Kageshima, Hisato Ogiso, Shizuka Nakano, Mark A. Lantzand Hiroshi Tokumoto
3962-3965 : A Silicon Based Nanometric Oscillator for Scanning Force Microcopy Operating in the 100 MHz Range: Hideki Kawakatsu, Hiroshi Toshiyoshi, Daisuke Saya and Hiroyuki Fujita

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