Table of Contents

Jpn. J. Appl. Phys. Vol.39 (2000)
Part 1, No. 6B, 30 June 2000

Special Issue: Scanning Probe Microscopy

3701-3706 : Dynamic Scanning Force Microscopy at Low Temperatures: Wolf Allers, Alexander Schwarz, Hendrik Hölscher, Udo Dietmar Schwarz and Roland Wiesendanger
3707-3710 : Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip: Nami Choi, Takayuki Uchihashi, Hidehiro Nishijima, Takao Ishida, Wataru Mizutani, Seiji Akita, Yoshikazu Nakayama, Mitsuru Ishikawa and Hiroshi Tokumoto
3711-3716 : Mechanical Properties of Membrane Surface of Cultured Astrocyte Revealed by Atomic Force Microscopy: Hatsuki Shiga, Yukako Yamane, Etsuro Ito, Kazuhiro Abe, Kazushige Kawabata and Hisashi Haga
3717-3720 : Differentiation of Au Islands on Ni Film by Friction Force Microscopy, Force Curve and New Force Modulation Method: Shin-ichi Yamamoto, Hirofumi Yamada and Kazumi Matsushige
3721-3723 : Kelvin Probe Force Microscopy on InAs Thin Films on (110) GaAs Substrates: Takuji Takahashi, Takashi Kawamukai, Shiano Ono, Takeshi Noda and Hiroyuki Sakaki
3724-3727 : Influence of Force Acting on Side Face of Carbon Nanotube in Atomic Force Microscopy: Seiji Akita, Hidehiro Nishijima, Takayoshi Kishida and Yoshikazu Nakayama
3728-3731 : Conductivity and Surface Potential Studies in Carbon Films by Conductive Scanning Probe Microscopy: Li Zhang, Tadashi Sakai, Naoshi Sakuma and Tomio Ono
3732-3735 : Surface Structure on Ar⁺-Ion Irradiated Graphite by Scanning Probe Microscopy: Bai An, Seiji Fukuyama, Kiyoshi Yokogawa and Masamichi Yoshimura
3736-3739 : Scanning Tunneling Microscopy and Barrier-Height Study of K-Adsorbed Si(111) 7×7: Shu Kurokawa, Jun Yoshikawa and Akira Sakai
3740-3743 : Mg/Si(100) Reconstructions Studied by Scanning Tunneling Microscopy: Osamu Kubo, Alexander A. Saranin, Andrey V. Zotov, Toru Harada, Tadashi Kobayashi, Nobumitsu Yamaoka, Jeong-Tak Ryu, Mitsuhiro Katayama and Kenjiro Oura
3744-3746 : Nanolithography of Organic Polysilane Films Using Carbon Nanotube Tips: Ai Okazaki, Seiji Akita, Hidehiro Nishijima and Yoshikazu Nakayama
3747-3749 : Development of a Versatile Atomic Force Microscope within a Scanning Electron Microscope: Kimitake Fukushima, Daisuke Saya and Hideki Kawakatsu
3750-3752 : Development of Low Temperature Ultrahigh Vacuum Atomic Force Microscope/Scanning Tunneling Microscope: Katsuyuki Suzuki, Masashi Iwatsuki, Shin-ichi Kitamura and Charles B. Mooney
3753-3757 : Simultaneous Imaging of Tunneling Current Variation by Noncontact Atomic Force Microscopy in Ultrahigh Vacuum: Toyoko Arai and Masahiko Tomitori
3758-3760 : Evaluation of an Electric Field over Sample Surfaces by Electron Standing Waves in a Vacuum Gap of Scanning Tunneling Microscopy: Yoshinori Suganuma and Masahiko Tomitori
3761-3764 : Atomic Force Microscopy of Living Cells: Tatsuo Ushiki, Susumu Yamamoto, Jiro Hitomi, Shigeaki Ogura, Takeshi Umemoto and Masatsugu Shigeno
3765-3768 : Structures of an Oxygen-Deficient TiO₂(110) Surface Studied by Noncontact Atomic Force Microscopy: Makoto Ashino, Takayuki Uchihashi, Kousuke Yokoyama, Yasuhiro Sugawara, Seizo Morita and Mitsuru Ishikawa
3769-3772 : Scanning Tunneling Microscopy Study of Surface Reconstructions of Rutile TiO₂(111): Hiroshi Uetsuka, Akira Sasahara and Hiroshi Onishi
3773-3776 : Noncontact-Mode Atomic Force Microscopy Observation of α-Al₂O₃(0001) Surface: Akira Sasahara, Hiroshi Uetsuka and Hiroshi Onishi
3777-3779 : Scanning Tunneling Microscopy Observation of Epitaxial bcc-Fe(001) Surface: Agus Subagyo, Hirofumi Oka, Guido Eilers, Kazuhisa Sueoka and Koichi Mukasa
3780-3783 : Surface Morphology of Thin Cu Films Grown on Magnesium Oxide (100): Guido Eilers and K\=oichi Mukasa
3784-3788 : Protein Stretching IV: Analysis of Force-Extension Curves: Atsushi Ikai and Tong Wang
3789-3792 : Scanning Tunneling Spectroscopy Study of TiO₂(110) Surface: Yoshiyuki Sakai and Shaw Ehara
3793-3798 : Fabrication of Silicon-Based Filiform-Necked Nanometric Oscillators: Daisuke Saya, Kimitake Fukushima, Hiroshi Toshiyoshi, Hiroyuki Fujita, Gen Hashiguchi and Hideki Kawakatsu
3799-3803 : Investigation of Nonswitching Regions in Ferroelectric Thin Films Using Scanning Force Microscopy: Yuko Saya, Shunji Watanabe, Maki Kawai, Hirofumi Yamada and Kazumi Matsushige
3804-3807 : Velocity Dependence and Limitations of Friction Force Microscopy of Mica and Graphite: Yasuo Hoshi, Takayoshi Kawagishi and Hideki Kawakatsu
3808-3810 : Simultaneous Observation of Ferroelectric Domain Patterns by Scanning Nonlinear Dielectric Microscope and Surface Morphology by Atomic Force Microscope: Hiroyuki Odagawa, Yasuo Cho, Hiroshi Funakubo and Kuniharu Nagashima
3811-3814 : Origin, Cause, and Electronic Structure of the Symmetric Dimers of Si(100) at 80 K: Kenji Hata, Tomohiko Kimura, Osamu Takeuchi and Hidemi Shigekawa
3815-3822 : Surface-State Bands on Silicon --Si(111)-√3×√3-Ag Surface Superstructure--: Shuji Hasegawa, Norio Sato, Ichiro Shiraki, Cristian L. Petersen, Peter B\oggild, Torben M. Hansen, Tadaaki Nagao and François Grey
3823-3826 : Comparison of the Symmetry Breaking in the Surface Molecular Structures of One- and Two-Dimensional Bis(ethylenedithio)tetrathiafulvalene Compounds: Masahiko Ishida, Osamu Takeuchi, Takehiko Mori and Hidemi Shigekawa
3827-3829 : Structures and Electrical Properties of Fullerene Thin Films on Si(111)-7×7 Surface Investigated by Noncontact Atomic Force Microscopy: Kei Kobayashi, Hirofumi Yamada, Toshihisa Horiuchi and Kazumi Matsushige
3830-3833 : Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy: Takeshi Fukuma, Kei Kobayashi, Toshihisa Horiuchi, Hirofumi Yamada and Kazumi Matsushige

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