Table of Contents

Jpn. J. Appl. Phys. Vol. 40 (2001)
Part 1, No. 6B, 30 June 2001

Special Issue: Scanning Probe Microscpy

4273-4276 : Scanning Tunneling Microscopy Characterization of Aromatic Molecules Stabilized by a Buffer Layer of Alkane Derivatives: Shengbin Lei, Bo Xu, Chen Wang, Qingmin Xu, Lijun Wan and Chunli Bai
4277-4280 : Scanning Tunneling Microscopy Barrier-Height Imaging of Shockley Dislocations on a Au(111) Reconstructed Surface: Shu Kurokawa, Yasuharu Yamashita, Akira Sakai and Yukio Hasegawa
4281-4284 : TiO₂ (110) Surface Preparation by UV Light Irradiation for Scanning Tunneling Microscopy Observations: Donghong Yin and Masaharu Komiyama
4285-4288 : Various Phases on Natural Stilbite (010) Surface Observed by Atomic Force Microscopy under Aqueous Conditions: Ning Gu and Masaharu Komiyama
4289-4291 : Structural Stability of Carbon Nanotube Tips on Nanoindentation of Polycarbonate: Seiji Akita and Yoshikazu Nakayama
4292-4298 : Characterization of Silicon Nitride Thin Films on Si and Overlayer Growth of Si and Ge: Xue-Sen Wang, Zongquan Li, Lei Wang, Yanfang Hu, Guangjie Zhai, Jianshu Yang, Yuqi Wang, Kwok-Kwong Fung, Jing-Chang Tang, Xun Wang and Nelson Cue
4299-4303 : Quantum Size Effects in Low-Temperature Growth of Pb Islands on Si(111)7× 7 Surfaces: Wei-Bin Su, Shih-Hsin Chang, Chia-Seng Chang, Lih Juann Chen and Tien T. Tsong
4304-4308 : Structural Transformations During Sb Adsorption on Si(111)-In(4×1) Reconstruction: Bommisetty V. Rao, Dimitry V. Gruznev, Toyokazu Tambo and Chiei Tatsuyama
4309-4313 : Oscillatory Forces in Liquid Atomic Force Microscopy: Sean J. O'Shea
4314-4316 : Kelvin Probe Force Microscopy Imaging Using Carbon Nanotube Probe: Satoru Takahashi, Takayoshi Kishida, Seiji Akita and Yoshikazu Nakayama
4317-4320 : Nanofabrication Using Atomic Force Microscopy Lithography Combined with Optical Lithography: Midori Kato, Masayoshi Ishibashi, Seiji Heike and Tomihiro Hashizume
4321-4324 : Room Temperature Sub-Micron Magnetic Imaging by Scanning Hall Probe Microscopy: Adarsh Sandhu, Hiroshi Masuda, Ahmet Oral and Simon J. Bending
4325-4327 : Improvement in Aspect Ratio of P-GaAs Oxide Fabricated by Atomic Force Microscope (AFM)-Based Nanolithography Using Pulsed Voltage: Yuichi Matsuzaki, Shigeki Hasui, Shin-ya Kamada, Akira Yamada and Makoto Konagai
4328-4330 : Carbon Nanotube Tip for Scanning Tunneling Microscope: Wataru Mizutani, Nami Choi, Takayuki Uchihashi and Hiroshi Tokumoto
4331-4333 : Atom-Resolved Structures of TiO₂(001) Surface by Scanning Tunneling Microscopy: Ken-ichi Fukui, Ryugo Tero and Yasuhiro Iwasawa
4334-4336 : Scanning Tunneling Spectroscopy of c(2×2) Reconstructed Fe Thin-Film Surfaces: Hirofumi Oka, Agus Subagyo, Makoto Sawamura, Kazuhisa Sueoka and K\=oichi Mukasa
4337-4339 : Photoluminescence of GaAs Tip Apex Excited by Evanescent Wave: Satoshi Hattori, Kazuhisa Sueoka, Yasuo Ohdaira, Hirokazu Hori and K\=oichi Mukasa
4340-4343 : In-Situ Electrical Study of a Reversible Surface Modification and a Nanomachining of Gold Microstrips by the Voltage-Biased Atomic Force Microscope Tip in Air: Byong Man Kim, Yo-Sep Min, Nae Sung Lee, Jung Hyun Sok, Moon Kyung Kim, Soo Doo Chae, Won Il Ryu and Hee Soon Chae
4344-4348 : Frictional Properties of Organosilane Self-Assembled Monolayer in Vacuum: Kazuyuki Hayashi, Hiroyuki Sugimura and Osamu Takai
4349-4353 : Higher Order Nonlinear Dielectric Imaging Using Scanning Nonlinear Dielectric Microscopy: Yasuo Cho and Koya Ohara
4354-4356 : Fundamental Study on Nano Domain Engineering Using Scanning Nonlinear Dielectric Microscopy: Kaori Matsuura, Yasuo Cho and Hiroyuki Odagawa
4357-4360 : Phase Transition of Silicon-Nitride Monolayer on Si(111) Surface Observed by Scanning Tunneling Microscopy: Yukinori Morita and Hiroshi Tokumoto
4361-4364 : Molecular Ferroelectricity of Vinylidene Fluoride Oligomer Investigated by Atomic Force Microscopy: Kei Noda, Kenji Ishida, Atsushi Kubono, Toshihisa Horiuchi, Hirofumi Yamada and Kazumi Matsushige
4365-4367 : Fabrication of a Nanogap on a Metal Nanowire Using Scanning Probe Lithography: Takashi Miyazaki, Kei Kobayashi, Toshihisa Horiuchi, Hirofumi Yamada and Kazumi Matsushige
4368-4372 : Scanning Probe Microscopy and Lithography of Ultrathin Si₃N₄ Films Grown on Si(111) and Si(001): Shangjr Gwo, Chung-Lin Wu, Forest Shih-Sen Chien, Tetsuji Yasuda and Satoshi Yamasaki
4373-4377 : Kelvin Probe Force Microscopy Images of Microstructured Organosilane Self-Assembled Monolayers: Hiroyuki Sugimura, Kazuyuki Hayashi, Nagahiro Saito, Osamu Takai and Nobuyuki Nakagiri
4378-4380 : A Step Toward Making and Wiring Up Molecular-Scale Devices: Robert A. Wolkow
4381-4383 : Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy: Keiichi Umeda, Kei Kobayashi, Kenji Ishida, Shu Hotta, Hirofumi Yamada and Kazumi Matsushige
4384-4387 : Effect of Hydrogen Termination on Ba Reaction on the Si(100) Surface: Kaoru Ojima, Masamichi Yoshimura and Kazuyuki Ueda
4388-4390 : N-Plasma Assisted Molecular Beam Epitaxy of GaN$(000\bar{1})$ Thin Films on 6H-SiC$(000\bar{1})$: Qi-Zhen Xue, Qi-Kun Xue, Satoko Kuwano, Koji Nakayama and Toshio Sakurai
4391-4394 : Elastic Scattering by a Metal Sphere with an Adsorbed Molecule as a Model for the Detection of Single Molecules by Scanning Probe Enhanced Elastic Resonant Scattering (SPEERS): Ulrich C. Fischer and Jörg Heimel
4395-4398 : Laser-Scanning Probe Microscope Based Nanoprocessing of Electronics Materials: Yong-Feng Lu, Bing Hu, Zhi-Hong Mai, Wei-Jie Wang, Wai-Kin Chim and Tow-Chong Chong
4399-4402 : Adsorption and Wetting Structures of Kr on Pt(111) at 8 K and 45 K Studied by Scanning Tunneling Microscopy: Yan Jun Li, Koji Miyake, Osamu Takeuchi, Don Norimi Futaba, Masuaki Matsumoto, Tatsuo Okano and Hidemi Shigekawa
4403-4408 : Scanning Tunneling Microscopy Observation of CO on Pd(110) at Cryogenic Temperature; Imaging Mechanism and Novel One-Dimensional Array Formation: Tadahiro Komeda, Yousoo Kim and Maki Kawai
4409-4413 : Manipulation of Atoms and Molecules with the Low-Temperature Scanning Tunneling Microscope: Gerhard Meyer, Francesca Moresco, Saw Wai Hla, Jascha Repp, Kai-Felix Braun, Stefan Fölsch and Karl Heinz Rieder
4414-4418 : Scanning Tunneling Microscopy Study on c(6×2) Structure of Ag/Si(001): Osamu Takeuchi, Masami Kageshima, Hiroshi Sakama and Akira Kawazu
4419-4422 : Interactive Force between Cyclodextrin Inclusion Complexes Studied by Atomic Force Microscopy: Shigeo Oyama, Koji Miyake, Satoshi Yasuda, Osamu Takeuchi, Jun Sumaoka, Makoto Komiyama, Don Norimi Futaba, Ryuji Morita, Mikio Yamashita and Hidemi Shigekawa
4423-4429 : Attenuated Total Reflection-Scanning Near-Field Raman Spectroscopy: Masayuki Futamata and Andreas Bruckbauer

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