Jpn. J. Appl. Phys. 22 (1983) pp. L284-L286  |Next Article|  |Table of Contents|
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Letter

Measurement of the Temperature Fluctuation in a Resistor Generating 1/f Fluctuation

Sumihisa Hashiguchi

(Received March 2, 1983; accepted for publication April 23, 1983)

A new method is devised to measure the temperature fluctuation in a current-carrying resistor. The spectrum of the temperature fluctuation is determined from the values of the resistance fluctuation, the variance fluctuation, and their product. It is found to be proportional to f^1.1 and the temperature fluctuation amounts to 0.13 K² in the frequency range of 10⁴–10² Hz. This agress well with the calculated value of the equilibrium temperature fluctuation in the effective volume generating 1/f noise.

URL: http://jjap.ipap.jp/link?JJAP/22/L284/
DOI: 10.1143/JJAP.22.L284

References

1. R. F. Voss and J. Clarke: Phys. Rev. B13 (1976) 556[APS].
2. T. G. M. Kleinpenning: Physica 84B (1976) 353.
3. R. F. Voss and J. Clarke: Phys. Rev. Lett. 36 (1976) 42[APS].
4. J. S. Bendat and A. G. Piersol: Random Data (John Wiley & Sons, New York, 1971) Chap. 6, p. 176.
5. H. G. E. Beck and W. P. Spruit: J. Appl. Phys. 49 (1978) 3384[AIP Scitation].
6. R. Y. Chiao, M. J. Feldman, H. Ohta and P. T. Parrish: Revue Phys. Appl. 9 (1974) 183.
7. F. N. Hooge: Physica 84B (1976) 14.