Jpn. J. Appl. Phys. 38 (1999) pp. L1265-L1267  |Next Article|  |Table of Contents|
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Interface and Domain Structures of (116)-Oriented SrBi₂Ta₂O₉ Thin Film Epitaxially Grown on (110) SrTiO₃ Single Crystal

Toshimasa Suzuki, Yuji Nishi, Masayuki Fujimoto, Katsuyuki Ishikawa¹ and Hiroshi Funakubo¹

(Received August 19, 1999; accepted for publication September 6, 1999)

The interface and domain structures in epitaxial (116)-oriented SrBi₂Ta₂O₉ films on (110) SrTiO₃ substrates were investigated by high-resolution transmission electron microscopy. The film contains domain boundaries due to the formation of two types of (116)-oriented crystallites with symmetrical tilted c-axis directions and numerous wavy c/6 translational boundaries originating from the domain boundaries. Each epitaxial crystallite forms a semicoherent interface accompanying periodic lattice strain, where the alternate continuity of perovskite layers in the film to the perovskite structure of SrTiO₃ is found. Such a quasi-stable interface structure may be the primary cause of difficulty in the preparation of epitaxial SrBi₂Ta₂O₉ films with the tilted c-axis.

KEYWORDS: layered perovskite structure, domain structure, transmission electron microscopy, epitaxial growth, strontium titanate substrate, MOCVD, twin
URL: http://jjap.ipap.jp/link?JJAP/38/L1265/
DOI: 10.1143/JJAP.38.L1265

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