Jpn. J. Appl. Phys. 45 (2006) pp. 1460-1462  |Previous Article| |Next Article|  |Table of Contents|
|Full Text PDF (139K)| |Buy This Article|

Statistical Analysis of Lifetime Distribution for Optical Recordable Disks

Mitsuru Irie and Yoshihiro Okino¹

(Received August 9, 2005; accepted November 21, 2005; published online February 24, 2006)

In this study, we examine the criteria for lifetime measurements using the Eyring acceleration test model and statistical analyses to evaluate high-density recordable optical disks. Two criteria are commonly used to determine disk lifetimes. One is the parity inner (PI) error number of the error correction code (ECC). The other is the jitter value (the channel clock to data). The results have demonstrated that the statistical distribution of lifetime data using jitter is a lognormal distribution. Using this criterion, we can estimate the standard life expectancy of high-density recordable optical disks as the minimum lifetime of 95% survival probability at a 95% confidence level.

KEYWORDS: archival data, Eyring acceleration model, life expectancy, optical disk, reliability
URL: http://jjap.ipap.jp/link?JJAP/45/1460/
DOI: 10.1143/JJAP.45.1460

References | Citing Articles (3)

1. M. Irie, Y. Okino and T. Kubo: Tech. Dig. ISOM 2004, 2004, p. 118.
2. P. A. Tobias and D. C. Trindade: Applied Reliability (Van Nostrand Reinhold, New York, 1995) 2nd ed., Chap. 7, p. 191.
3. ISO 18927 (2002).